NanoMet: Automated Dimensional Analysis of Nanomaterials will be showcased during The World Innovation Conference & Expo at the Gaylord National Resort & Convention Center in Washington, D.C. Jeffrey Whalen, President and CEO of FullScaleNANO, Inc., will be conducting the discussion on May 24, 2016 at 4:00 p.m. during the Session Focus Area “Innovation Spotlights: Materials.” Link to the Showcase
This innovation presentation will highlight NanoMet, a new dimensional analysis software that converts images of nanomaterials into usable data. NanoMet is objective software that yields thousands of measurements in seconds at a cost of pennies per measurement. The presentation will provide insight on the dimensional analysis capabilities of NanoMet which are easy to use, reliable and fast. NanoMet is currently available as a customized service and will soon be available as the first internet-based dimensional analysis software specifically aimed at addressing the challenges for automatic characterization of nanomaterials.
For more information, visit www.fullscalenano.com
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