Skip to content
FullScaleNano
FullScaleNano
Measurement and analysis of Nanomaterials
  • NanoMet
    • NanoMet Cloud
    • Appnotes
  • Company
    • About
    • News
  • Contact

REQUEST FREE TRIAL

  • NanoMet
    • NanoMet Cloud
    • Appnotes
  • Company
    • About
    • News
  • Contact

Companies Now Can Bring Fast and Accurate Nanoparticle Analysis In-House

Tallahassee, Fla. – Nanotechnology manufacturers seeking ways to measure and analyze nanoparticles now have a simple, fast, accurate and cost-effective tool thanks to the recent release of NanoMet by developer FullScaleNANO.

NanoMet is a simple user-friendly program that provides detailed analysis of nanomaterials in a matter of seconds. Users upload nanoparticle imagery (captured by an electron microscope), guide the software in two easy steps, then run the program. In seconds, NanoMet delivers histograms, detailed measurements and a thorough analysis of the user’s images in a PDF report.

NanoMet is available for the first time as a cloud based application that can run analysis anywhere at any time. FullScaleNANO, the Tallahassee based company that developed the NanoMet software,
originally managed analysis and client reporting for each nanomaterial image submitted. FullScaleNANO believes the new licensing option will benefit nanotechnology companies by giving them a simple way to handle their own analysis. Measurements of nanoparticles are easier, faster, less costly, and more frequent using NanoMet.

“By licensing our software, we help nanotechnology customers develop new products by giving them a simple, fast, data-rich analysis tool. Companies will now be able to run their own reports in a timely and cost-effective manner. NanoMet is even fun to use,” said FullScaleNANO CEO Jodi Chase.

To learn more about FullScaleNANO and its NanoMet software, visit www.fullscalenano.com. Software demonstrations and pricing options are available.

Post navigation

PreviousPrevious post:Manufacturers to Have a Less Costly Alternative for Measuring NanomaterialsNextNext post:Hello world!

Related posts

Manufacturers to Have a Less Costly Alternative for Measuring Nanomaterials
November 18, 2016
FullScaleNano to Receive TechConnect innovation Award at TechConnect World Innovation Conference and Expo May 22-25
May 4, 2016
FullScaleNano to Present Nanomet at TechConnect World 2016 Innovation Showcase
March 24, 2016

APPNOTES

Measuring the Unmeasurable
June 8, 2017
Statistical Distributions Using NanoMet
June 8, 2017
Sample Size Matters and Nanomet is Your Solution
May 11, 2017
The Importance of Many Measurements
April 11, 2017
Gateway to Integrated Image Utilization
March 11, 2017

PRESS

Manufacturers to Have a Less Costly Alternative for Measuring Nanomaterials
November 18, 2016
Companies Now Can Bring Fast and Accurate Nanoparticle Analysis In-House
November 11, 2016
FullScaleNano to Receive TechConnect innovation Award at TechConnect World Innovation Conference and Expo May 22-25
May 4, 2016
FullScaleNano to Present Nanomet at TechConnect World 2016 Innovation Showcase
March 24, 2016

QUICK LINKS

  • Nanomaterial Analysis Software
  • Histogram on Demand
  • Company Overview
  • Contact Us
  • Terms and Conditions

CONNECT

Copyright 2016 FullScaleNANO, Inc.

© Copyright 2017 - FullScaleNANO | All rights reserved. Site by Digital Opps